KEYCOM Products

Permittivity and Dielectric loss tangent Measurement Systems (εr', tanδ/Dk, Df) Model No. DPS

Open Resonator Method
Dielectric Constant and Dielectric Loss Tangent(Dk/Df)
Measurement System
[film, thin film, sheet, liquid, millimeter wave, high precision, Dk, Df, εr', tanδ, dielectric loss, measuring device]

Model No. DPS03

Highly precise Millimeter Wave measurement ! Ideal solution for 76.5GHz, 110GHz, 170GHz etc. measurement !!

KEYCOM’s ultra-thin sheet measurement system employs the Fabry-Perot resonator, a linear optical resonator which consists of two highly reflecting mirrors, which combines the high measurement accuracy in the millimeter wave range and simplicity of installing the specimens.
The feature is that the system can measure samples with small loss tangent(tanδ).
The system also has a reputation as a method for measuring low-loss liquids in the high-frequency band.

• Very accurate measurement : ex. PTFE@76.5GHz / εr' 2.05, tanδ 0.0004 • Measurement of ultra-thin film(ex. 5μm) • Easy operation • Measurement of oil and solvent in high frequency band • Measurement frequency range : 18GHz-110GHz

Measurable Samples(Example)
PCB, Film(Ultra thin film, thin sheet), Ceramics, Radome cover, Resin etc.

Electric Field Direction
Longitudinal or transverse parallel to the ground / in the sample plane
⇒ Anisotropy in the sample plane can be checked

Specifications

Components and parts No.

Measurement steps

1. Specify frequency range, frequency steps, measurement parameters(εr, tanδ, Q)
2. Name specimen, input width
3. Insert specimen
4. Start Measurement
5. Specify format of graphical output and numerical data output

Configurations

Appearance

MDM-02(Measurement of film , sheet)
MDM-03(Measurement of liquid , sheet)