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    KEYCOM Products

    Permittivity and Dielectric loss tangent Measurement Systems (εr', tanδ/Dk, Df) Model No. DPS

    Resonance Method Strip Line Type
    Dielectric Constant and Dielectric Loss Tangent(Dk/Df)
    Measurement System for Sheet
    [Films, Sheet, Dk, Df, εr', tanδ]

    Model No. DPS50


    Capable of measuring εr / tanδ of a thickness direction ! Suitable for measurering circuit materials !!

    DPS50 is a resonance method, strip line type dielectric constant and dielectric loss tangent measurement system optimized for sheet materials with dielectric constant of approximately 1 to 40 and relatively small dielectric loss in the frequency range of 800 MHz to 14GHz.
    This system is compliant with the ASTMD3380 standard method of test for permittivity (dielectric constant) and dissipation factor of plastic-based Microwave circuit substrates, and IPC-TM-650 2. 5. 5. 5. 1 strip line test for complex relative permittivity of circuit board materials to 14GHz.
    The measurement technique was announced at 2008 IEEE I2MTC. IEEE 2008 I2MTC Victoria Canada, paper#1569085274,Tue_20 12-15 May 2008

    Features

    Place a sample on 2 different PCB resonators and overlay the metal lid on each to apply pressure, and take measurements twice.
    This method will

       1.eliminate the fringing effect
       2.eliminate conductor loss of resonator
       3.eliminate the necessity for creating resonance pattern
       4.generate an electric field perpendicular to the sample sheet

    Conforming Standards

    ASTMD3380, IPC-TM-650 2. 5. 5. 5. 1

    Measurable Sample(Example)

    Dielectric materials for printed circuit boards.

    Electric Field Direction

    Perpendicular to the ground, in the direction of the sample thickness
    ⇒ Combined with other planar measurement methods, it is possible to confirm anisotropy in the thickness and planar directions

    Specifications

    Order information : Model No.

    Configurations

    Test example (English version available)