Perturbation Method
Specimen-Hole Closed Type, Cylindrical Cavity Resonator
Dielectric Constant and Dielectric Loss Tangent Measurement System(Dk/Df)
[Powders, film, ultra-thin sheet, ultra-thin film, sheet, millimeter wave, high accuracy, Dk/Df, εr', tanδ]

Model No. DPS18

High accuracy allows measurement of films, powders, etc. Accurate measurement of ceramics in the low frequency band @ 200MHz is also possible!

KEYCOM’s high precision perturbation method enables you to measure dielectric constant (permittivity, εr) and dielectric loss tangent (tan δ) of such specimens as multi-layered structure, ultra-thin film or ferroelectric materials in the microwave region.
KEYCOM refined the conventional perturbation method that was JIS-standardized in 1992 (JISC2565) by closing the hole into which the specimen is inserted with metal, and the new method is also compliant with ASTMD2520.

* High accuracy : εr' ±1%, tan δ ±3%.
* Ultra-thin films (less than 0.1μm in thickness) - capable of measurement
* Multi-layer film(Vapor-deposited film) - capable of measurement
* Also ideal for solids, sheets, powders, liquids (oils, etc.)
* User-friendly operability.
* Measurement frequency range : 200 MHz - 10 GHz.

* Please contact your KEYCOM representative for other measurement temperatures than room temperature.