This system measures εr、and tanδof dielectric sheet and clayish specimens in the range of 500MHz - 40GHz.
In case of measuring powder-like specimens it is possible to measure by adding optional software tools to calculate permittivity and tanδ with the shade density and the true density of the powder specimens , temperature measurement equipment and temperature dependence calculation soft.
And it enables evaluation of the voltage dependence of εr tanδ by impressing Bias.
It consists of the Cut Back method using propagation lines and has merits below.
Improvement of accuracy and simplification of measuring by correcting reflective loss caused by a mismatching of Characteristic Impedance.
Continuously variable frequency (frequency sweep).
The test kit for the Cut Back is designed to achieve 50Ωwhen the kit pinches specimens.
