Capacitance Method:
Dielectric Constant and Dielectric Loss Tangent Measurement System(Dk/Df)
for Flat Plate, Liquid, Gel, Ultra-Thin Film, Thin-film Compounds
(Dk, Df/ ε′r, tanδ/ μ′r, μ"r)

Model No. DPS17

High accurate measurement! Customizing for measurement requests (correspondence to high temperature) is available.

This model is a system to measure relative permittivity and dielectric loss tangent
for flat plates, liquid, and gel (measurement temperature can be changed with a jig).
It has an interface for external control by CPU.
In addition to measurement in room temperature, it is capable of automatic measurement with a temperature change,
which usually takes a long time.

*Windows PC is required.
*Thermostat chamber is required for temperature above or below room temperature.
ASTM D-150, JIS C2101, JIS C2141, JIS K6911 JIS C 2111 28.1.2 (Bmethod) etc. Compliant.
(Please specify your required standard(s) so that an applicable jig would be introduced.