RTS02 measures relative permittivity (dielectric constant), dielectric loss tangent based on a correlation between measurement frequency and transmission attenuation as the millimeter wave passes through the flat plane sample.
(Measurement value is the average value in the measurement frequency range.)
The optimum thickness of the dielectric onstant to the frequency (the most loss reduced thickness) can be calculated.
Despite its compact dimensions, your sample can be measured with plane wave because the lenses are attached to the antennas,
providing high measurement accuracy.
Samples can be smaller than conventional systems because they can be placed in the vicinity of the antennas.
Also, It lets you measure reflection attenuation of electric wave absorber with optional software.
Note) The higher the measurement frequency is, the smaller the samples can be.
*By applying the gate beyond the lenses closer to the sample, transmission attenuation and relative permittivity can be acquired by the resolution of 0.1dB and 0.01 respectively, using a standard vector network analyzer with time-domain option.
*Scholar network analyzer, synthesized sweeper also applicable.
