(주)티앤씨

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Digital Multimeter & System
Specialized Power Supplies
Source And Measure
Picoammeter/Voltage Source
 


2400 소스미터 제품 군
2600A 시스템 소스미터 멀티채널 I-V 테스트 솔루션
237 High-Voltage Source-Measure Unit
 
2600A 시스템 소스미터 멀티채널 I-V 테스트 솔루션
 
  • Combines a power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller – all in one instrument
  • Backward code compatible to Series 2600 System SourceMeter® Instruments for drop-in replacement
  • TSP® Express software tool for quick and easy I-V test
  • Precision timing and channel synchronization (<500ns)
  • Parallel test execution for unmatched throughput
  • 20,000 rdg/s provides faster test times and ability to capture transient device behavior
  • Family of products offers wide dynamic range: 1fA to 10A and 1µV to 200V
  • TSP-Link® bus allows up to 32 units/64 channels of channel expansion per GPIB or IP address
  • Test Script Processor (TSP®) runs complete test programs (scripts) in the instrument for unparalleled system automation
  • USB port for saving data and test scripts
  • LXI Class C compliance provides high speed data transfer and enables quick, easy remote testing, monitoring, and troubleshooting
 

Model

2601A
2602A

2611A
2612A

2635A
2636A

Description

Sclable, high throughput

High voltage and pulse output

Low current and pulsed output

Current Source/Sink

  •  
  •  

 

Voltage Source/Sink

  •  
  •  

 

Power Output

40.4W/channel

30.3W/channel

30.3W/channel

Current Capability

Min.

±1pA

±1pA

±1fA

Max.

±3.03A DC and pulsed/10A pulsed per channel

±1.5A DC and pulsed/10A pulsed per channel

±1.5A DC and pulsed/10A pulsed per channel

Voltage Capability

Min.

±1uV

±1uV

±1uV

Max.

±40.4V/channel

±202V

±202V

Basic Accuracy

I

0.02%

0.02%

0.02%

V

0.015%

0.015%

0.015%

Applications

 

• I-V functional test and characterization
• Wafer level reliability test
• Testing integrated devices such as RFICs, ASICs, SOCs
• Testing opto devices such as LEDs, VCSELs, and displays
• Testing nano-devices and materials

Feature Summary

 

 

 

Pulse Mode

Yes

Yes

Yes

Linear/Log/Custom Sweeps

Yes

Yes

Yes

Embedded Execution

Yes

Yes

Yes

Embedded Scription

Yes

Yes

Yes

Contact Check

Yes

Yes

Yes

Selectable Front/Rear Inputs

Rear only

Rear only

Rear only

Connections

Screw terminal, adapters for banana and triax

Limit Inspection

Yes

Yes

Yes

Selectable Output-Off Impedance State

Yes

Yes

Yes

Remote or 4W Voltage Sense

Yes

Yes

Yes

Source Readback

Yes

Yes

Yes

Commadn Laguage Protocol

ICL

ICL

ICL

Programming

LXI, IEEE-488, RS-232 communication with embedded
Test Script Processor (TSP) capability

Memory/Buffer

>100,000 rdgs/buffer

Trigger

14 digital I/O-trigger lines, 3 TSP-Link trigger lines

Guard

Cable

Digital I/O

14 digital I/O-trigger lines

Other

Scalable to 64+ channels with TSP-Link™

Compliance

CE, UL

 
 
 
 


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