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| 237 High-Voltage Source-Measure Unit |
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- Combines a power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller – all in one instrument
- Backward code compatible to Series 2600 System SourceMeter® Instruments for drop-in replacement
- TSP® Express software tool for quick and easy I-V test
- Precision timing and channel synchronization (<500ns)
- Parallel test execution for unmatched throughput
- 20,000 rdg/s provides faster test times and ability to capture transient device behavior
- Family of products offers wide dynamic range: 1fA to 10A and 1µV to 200V
- TSP-Link® bus allows up to 32 units/64 channels of channel expansion per GPIB or IP address
- Test Script Processor (TSP®) runs complete test programs (scripts) in the instrument for unparalleled system automation
- USB port for saving data and test scripts
- LXI Class C compliance provides high speed data transfer and enables quick, easy remote testing, monitoring, and troubleshooting
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Model |
237 |
Description |
Low current, 1100V |
Current Source/Sink |
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Voltage Source/Sink |
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Power Output |
11W |
Current Capability |
Min. |
±100fA |
Max. |
±100mA |
Voltage Capability |
Min. |
±100uV |
Max. |
±1100V |
Basic Accuracy |
I |
0.05% |
V |
0.03% |
Applications |
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• Semiconductor laser diode DC/CW characterization
• DC/CW characterization of transceiver modules
• PIN and APD characterization
• Carbon nanotube characterization
• Materials research
• Nanoelectronics |
Feature Summary |
Pulse Mode |
Yes |
Linear/Log/Custom Sweeps |
Yes (linear/log/pulse, fixed, stair, custom) |
Embedded Execution |
No |
Embedded Scription |
No |
Contact Check |
No |
Selectable Front/Rear Inputs |
Rear only |
Connections |
3-lug triax |
Limit Inspection |
No |
Remote or 4W Voltage Sense |
Yes |
Source Readback |
No |
Commadn Laguage Protocol |
DDC |
Programming |
IEEE-488 |
Memory/Buffer |
1000pt. |
Trigger |
No |
Guard |
Cable |
Digital I/O |
No |
Compliance |
CE |
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